Showing posts with label atomic. Show all posts
Showing posts with label atomic. Show all posts

Friday, 29 May 2015

ATOMIC ABSORPTION SPECTROMETRY

INTRODUCTION

Atomic Absorption Spectrometry (AAS) is a technique which is used for the analysis of quantities of elements present in a sample by measuring the absorbed radiation by the chemical element of interest.
This is done by measuring the spectra produced when the sample is excited by radiation. The atoms absorb ultraviolet or visible light and get excited to higher energy levels. Atomic absorption technique measures the amount of energy in the form of photons of light that are absorbed by the sample.
A detector measures the wavelengths of light transmitted by the sample, and compares them to the wavelengths which originally passed through the sample. A signal processor then integrates the changes in wavelength absorbed, which appear in the readout as peaks of energy absorption at discrete wavelengths.

The energy required for an electron to leave an atom is known as ionization energy and is specific to each and every element. When an electron moves from one energy level to another within the atom, a photon is emitted with energy E. Atoms of an element emit a characteristic spectral line. Every atom has its own distinct pattern of wavelengths at which it will absorb energy, due to the unique configuration of electrons in its outer shell.
This enables the qualitative analysis of a sample. The concentration is calculated based on the Beer-Lambert law. Absorbance is directly proportional to the concentration of the analyte absorbed for the existing set of conditions. The concentration is usually determined from a calibration curve, obtained using standards of known concentration or certified reference materials (CRMs). However, applying the Beer-Lambert law directly in AAS is difficult due to:
·       variations in atomization efficiency from the sample matrix non-uniformity of concentration and path length of analyte atoms (in graphite furnace AA).

The chemical methods used are based on matter interactions, i.e. chemical reactions. For a long period of time these methods were essentially empirical, involving, in most cases, great experimental skills. In analytical chemistry, AAS is a technique used mostly for determining the concentration of a particular metal element within a sample. AAS can be used to analyse the concentration of over 62 different metals in a solution. Typically, the technique makes use of a flame to atomize the sample, but other atomizers, such as a graphite furnace, are also used. Three steps are involved in turning a liquid sample into an atomic gas:

1. Desolvation – the liquid solvent is evaporated, and the dry sample remains;
2. Vaporization – the solid sample vaporizes to a gas; and
3. Volatilization – the compounds that compose the sample are broken into free atoms.

To measure how much of a given element is present in a sample, first of all , we must establish a basis for comparison using certified reference materials or known quantities of that element to produce a calibration curve.
To generate this curve, a specific wavelength is selected, and the detector (Usually Photomultiplier tube detectors are used) is set to measure only the energy transmitted at that wavelength. As the concentration of the target atom in the sample increases, the absorption will also increase proportionally.

A series of samples containing known concentrations of the element to be measured are analysed, and the corresponding absorbance, which is the inverse percentage of light transmitted, is recorded.

The measured absorption at each concentration is then plotted, so that a straight line can then be drawn between the resulting points. From this line, the concentration of the substance under investigation is extrapolated from the substance’s absorbance. The use of special light sources and the selection of specific wavelengths allow for the quantitative determination of individual components in a multi-element mixture.

BASIC PRINCIPLE

The selectivity in AAS is very important, since each element has a different set of energy levels and gives rise to very narrow absorption lines. Hence, the selection of the monochromator is vital to obtain a linear calibration curve (Beers' Law), the bandwidth of the absorbing species must be broader than that of the light source; which is difficult to achieve with ordinary monochromators. The monochromator is a very important part of an AA spectrometer because it is used to separate the thousands of lines generated by all of the elements in a sample.

Without a good monochromator, detection limits are severely compromised. A monochromator is used to select the specific wavelength of light that is absorbed by the sample and to exclude other wavelengths. The selection of the specific wavelength of light allows for the determination of the specific element of interest when it is in the presence of other elements. The light selected by the monochromator is directed onto a detector,typically a photomultiplier tube, whose function is to convert the light signal into an electrical signal proportional to the light intensity. The challenge of requiring the bandwidth of the absorbing species to be broader than that of the light source is solved with radiation sources with very narrow lines.

The study of trace metals in wet and dry precipitation has increased in recent decades because trace metals have adverse environmental and human health effects. Some metals, such as Pb, Cd and Hg, accumulate in the biosphere and can be toxic to living systems.
Anthropogenic activities have substantially increased trace metal concentrations in the atmosphere. In addition, acid precipitation promotes the dissolution of many trace metals, which enhances their bioavailability. In recent decades, heavy metal concentrations have increased not only in the atmosphere but also in pluvial precipitation. Metals, such as Pb, Cd, As, and Hg, are known to accumulate in the biosphere and to be dangerous for living organisms, even at very low levels. Many human activities play a major role in global and regional trace element budgets. Additionally, when present above certain concentration levels, trace metals are potentially toxic to marine and terrestrial life. Thus, biogeochemical
perturbations are a matter of crucial interest in science.

The atmospheric input of metals exhibits strong temporal and spatial variability due to short atmospheric residence times and meteorological factors. As in oceanic chemistry, the impact of trace metals in atmospheric deposition cannot be determined from a simple consideration of global mass balance; rather, accurate data on net air or sea fluxes for specific regions are needed.

Particles in urban areas represent one of the most significant atmospheric pollution problems, and are responsible for decreased visibility and other effects on public health, particularly when their aerodynamic diameters are smaller than 10 μm, because these small particles can penetrate deep into the human respiratory tract. There have been many studies measuring concentrations of toxic metals such as Ag, As, Cd, Cr, Cu, Hg, Ni, Pb in rainwater and their deposition into surface waters and on soils. Natural sources of aerosols include terrestrial dust, marine aerosols, volcanic emissions and forest fires. Anthropogenic particles, on the other hand, are created by industrial processes, fossil fuel combustion, automobile mufflers, worn engine parts, and corrosion of metallic parts. The presence of metals in atmospheric particles are directly associated with health risks of these metals. Anthropogenic sources have substantially increased trace metal concentrations in atmospheric deposition.

The instrument used for atomic absorption spectrometry can have either of two atomizers. One attachment is a flame burner, which uses acetylene and air fuels. The second attachment consists of a graphite furnace that is used for trace metal analysis. Figure 1 depicts a diagram of an atomic absorption spectrometer.



Fig. 1. The spectral, or wavelength, range captures the dispersion of the grating across the linear array.
           
 Flame and furnace spectroscopy has been used for years for the analysis of metals. Today these procedures are used more than ever in materials and environmental applications. This is due to the need for lower detection limits and for trace analysis in a wide range ofsamples. Because of the scientific advances of Inductively Coupled Plasma Optical Emission Spectroscopy (ICP-OES), Inductively Coupled Plasma Mass Spectrometry (ICP-MS), have left Atomic Absorption (AA) behind. This technique, however, is excellent and has a larger specificity that ICP does not have.

Figure 2 shows a diagram of an atomic absorption spectrometer with a graphite furnace.


 AAS is a reliable chemical technique to analyze almost any type of material. This post describes the basic principles of atomic absorption spectroscopy in the analysis of trace metals, such as Ag, As, Cd, Cr, Cu, and Hg, in environmental samples. For example, the study of trace metals in wet and dry precipitation has increased in recent decades because trace metals have adverse environmental and human health effects. Anthropogenic activities have substantially increased trace metal concentrations in the atmosphere. In recent decades, heavy metal concentrations have increased not only in the atmosphere but also in pluvial precipitation.
Many human activities play a major role in global and regional trace element budgets. Additionally, when present above certain concentration levels, trace metals are potentially toxic to marine and terrestrial life. Thus, biogeochemical perturbations are a matter of crucial interest in science.
The atmospheric input of metals exhibits strong temporal and spatial variability due to short atmospheric residence times and meteorological factors. As in oceanic chemistry, the impact of trace metals in atmospheric deposition cannot be determined from a simple consideration of global mass balance; rather, accurate data on net air or sea fluxes for specific regions are needed.

Particles in urban areas represent one of the most significant atmospheric pollution
problems, and are responsible for decreased visibility and other effects on public health, particularly when their aerodynamic diameters are smaller than 10 μm, because these small particles can penetrate deep into the human respiratory tract. There have been many studies measuring concentrations of toxic metals such as Ag, As, Cd, Cr, Cu, Hg, Ni, Pb in rainwater and their deposition into surface waters and on soils. Natural sources of aerosols include terrestrial dust, marine aerosols, volcanic emissions and forest fires. Anthropogenic particles, on the other hand, are created by industrial processes, fossil fuel combustion, automobile mufflers, worn engine parts, and corrosion of metallic parts. The presence of metals in atmospheric particles and the associated health risks of these metals.

Anthropogenic sources have substantially increased trace metal concentrations in
atmospheric deposition. In addition, acid precipitation favors the dissolution of many trace metals, which enhances their bioavailability. Trace metals from the atmosphere are deposited by rain, snow and dry fallout. The predominant processes of deposition by rain are rainout and washout (scavenging). Generally, in over 80 % of wet precipitation, heavy metals are dissolved in rainwater and can thus reach and be taken up by the vegetation blanket and soils. Light of a specific wavelength, selected appropriately for the element being analyzed, is given off when the metal is ionized in the flame; the absorption of this light by the element of interest is proportional to the concentration of that element.

Quantification is achieved by preparing standards of the element.
  • AAS intrinsically more sensitive than Atomic Emission Spectrometry (AES)
  • Similar atomization techniques to AES
  • Addition of radiation source
  • High temperature for atomization necessary
  • Flame and electrothermal atomization
  • Very high temperature for excitation not necessary; generally no plasma/arc/spark in AAS

We will discuss the Flame AAS technique and AAS with Graphite Furnace (GFAA) in the upcoming posts.

Thursday, 16 May 2013

ATOMIC FORCE MICROSCOPY


Atomic force microscopy (AFM) or scanning force microscopy (SFM) is a very high-resolution type of scanning probe microscopy, with demonstrated resolution on the order of fractions of a nanometer, AFM provides a 3D profile of the surface on a nanoscale, by measuring forces between a sharp probe (<10 nm) and surface at very short distance (0.2-10 nm probe-sample separation). The probe is supported on a flexible cantilever. The AFM tip “gently” touches the surface and records the small force between the probe and the surface.
The AFM measures the forces acting between a fine tip and a sample. The tip is attached to the free end of a cantilever, The cantilever is typically silicon or silicon nitride with a tip radius of curvature on the order of nanometres and it is brought very close to a surface. Attractive or repulsive forces resulting from interactions between the tip and the surface will cause a positive or negative bending of the cantilever. The bending is detected by means of a laser beam, which is reflected from the back side of the cantilever. The figure  shows the basic concept of AFM :


What types of forces are measured?

Plot of force as a function of probe-sample separation
The dominant interactions at short probe-sample distances in the AFM are Van der Waals interactions. However long-range interactions (i.e. capillary, electrostatic, magnetic) are significant further away from the surface. These are important in other SPM methods of analysis. During contact with the sample, the probe predominately experiences repulsive Van der Waals forces (contact mode). This leads to the tip deflection described previously. As the tip moves further away from the surface attractive Van der Waals forces are dominant (non-contact mode).


Modes of operation

CONTACT MODE

In the So-called contact-AFM mode, the tip makes soft “physical contact” with the surface of the sample. The deflection of the cantilever Dx is proportional to the force acting on the tip, via Hook’s law, F=-k. x, where k is the spring constant of the cantilever. In contact-mode the tip either scans at a constant small height above the surface or under the conditions of a constant force. In the constant height mode the height of the tip is fixed, whereas in the constant-force mode the deflection of the cantilever is fixed and the motion of the scanner in z-direction is recorded. By using contact-mode AFM, even “atomic resolution” images are obtained. For contact mode AFM imaging, it is necessary to have a cantilever which is soft enough to be deflected by very small forces and has a high enough resonant frequency to not be susceptible to vibration instabilities. Silicon Nitride tips are
used for contact mode. In these tips, there are 4 cantilever with different geometries attached to each substrate, resulting in 4 different spring constants.
Probe with four different cantilevers with different spring constants (N/m
Advantages:
  • High scan speeds
  • Atomic resolution” is possible
  • Easier scanning of rough samples with extreme changes in vertical topography
Disadvantages:
  • Lateral forces can distort the image.
  • Capillary forces from a fluid layer can cause large forces normal to the tip sample interaction
  • Combination of these forces reduces spatial resolution and can cause damage to soft samples.
INTERMITTENT MODE (TAPPING)


The imaging is similar to contact. However, in this mode the cantilever is oscillated at its resonant frequency, Figure 4. The probe lightly “taps” on the sample surface during scanning, contacting the surface at the bottom of its swing. By maintaining a constant oscillation amplitude a constant tip-sample interaction is  maintained and an image of the surface is obtained.

Advantages:

  • Higher lateral resolution (1 nm to 5 nm).
  • Lower forces and less damage to soft samples in air.
  • Almost no lateral forces.
Disadvantage:

  • Slower scan speed than in contact mode.
  
  NON CONTACT MODE

(Attractive VdW) The probe does not contact the sample surface, but oscillates above the adsorbed fluid layer on the surface during scanning. (Note: all samples unless in a controlled UHV or environmental chamber have some liquid adsorbed on the surface). Using a feedback loop to monitor changes in the amplitude due to attractive VdW forces the surface topography can be measured.

Advantage:

  • VERY low force exerted on the sample(10-12 N), extended probe lifetime.
Disadvantages:

  • Lower lateral resolution, limited by tip-sample separation.
  • Contaminant layer on surface can interfere with oscillation; usually need ultra-high vacuum (UHV) to have best imaging.
  • Slower scan speed to avoid contact with fluid layer.
  • Usually only applicable in extremely hydrophobic samples with a minimal fluid layer.


Applications :

The number of applications for AFM has exploded since it was invented in 1986 and Nowadays this technique is involved in many fields of Nanoscience and nanotechnology. The remarkable feature of STM and AFM instruments is their ability to examine samples not only in an ultrahigh vacuum but also on ambient conditions or even in liquids. AFM can image the non-conducting surfaces, and therefore it is very suitable for biological systems.

Possible applications of AFM are :

  • Substrate roughness analysis.
  • Step formation in thin film epitaxial deposition.
  • Pinholes formation or other defects in oxides growth.
  • Grain size analysis.
  • Phase mode is very sensitive to variations in material properties, including surface stiffness, elasticity and adhesion.
  • Comparing the tip-samples forces curves for materials to study the ratio of Young´s Modulus (graphite as a reference for measure of the indentation).
  • Obtaining information of what is happening under indentation at very small loads .
  • By In situ AFM analysis with changes in temperature we can study changes in the structure.


References :

1.  Basic Theory Atomic Force Microscopy (AFM) by  Robert A. Wilson and Heather A. Bullen,* Department of Chemistry, Northern Kentucky University, Highland Heights
2.  Principles of atomic force microscopy (AFM) written by Arantxa Vilalta-Clemente , Aristotle University, Thessaloniki, Greece and Kathrin Gloystein, Aristotle University, Thessaloniki, Greece