Showing posts with label spectra peaks. Show all posts
Showing posts with label spectra peaks. Show all posts

Thursday, 26 February 2015

CALIBRATION AND THE ROLE OF CALIBRATION SAMPLES IN METAL OPTICAL EMISSION SPECTROMETER.

THEORY OF CALIBRATION:

Concentration vs Intensity calibration curve
Calibration comprises measurement of calibration samples and determination of the functional relationship between the intensity ‘I’ of the line of an analyte and its concentration c in these samples. The functional relationship is the calibration function or calibration curve. It includes relationships between vaporisation, excitation, radiation offtake, dispersion and the measured value. Since spectrochemical analysis is a process of analysis is a process of analysis by comparison ( in contrast to absolute methods such as weighing ), it is necessary to carry out calibration with samples of accurately known concentration, the calibration samples.

The calibration function must not be confused with the function inverse to it-the read out or evaluation function. In the case of the calibration function I = f1 (c), the concentrations of the calibration samples are assumed to be free of error, and the errors (deviations from a best fit curve after correction of the intensities for systematic errors) are imputed entirely to the spectrometer method, so that the preconditions for regression calculations showing correlation coefficients as a quality index are useless. With the evaluation function c = f2 = ( I ) the concentration c of an analyte in an analytical sample is determined, which is accordingly subject to error, f2 = 1/f1.

For optical emission spectrometry there is no theory of calibration curves which can be used for practical purposes. There are formulae for which it is assumed that it is possible to represent the relationship between line intensity and concentration as a power function : I = I0 ck. The calibration function can be represented mathematically in various ways :

linear calibration function : I = f(c) = a0 + a1 c
non-linear calibration function : I =f(c) = a0 + a1 c +a2 c2+...+an cn

The extent to which the regression approaches the true course of the calibration
curve can be discerned from the residual scatter, namely at the point when the
addition of further terms to the approximation function does not produce any
further improvement in the residual scatter.

CALIBRATION SAMPLES


Fundamental role of the calibration samples is attested by international community and by International Standardisation Organization (ISO), which delivered the following definitions :
Reference Materials (RM) : they are Materials or substances whose properties are so well defined that they can be used to calibrate the instrument, verify the measure or assign values to the materials.

CRM sample with Spark analysis spots
Certified Reference Materials (CRM) : they are Materials whose values concerning one or more properties are certified by means of a valid technical procedure and equipped by a Certificate or other documents from a qualified technical Body ( public or private Organization or Society., which deliver a certificate for the Reference Material )

Calibration samples present three disadvantages :
1) They are expensive
2) Their dimensions and shapes are not always available for the sample-holder stand of the spectrometer.
3) They are available only for some elements and concentrations

In some cases calibration samples can be synthesised, for example by alloying or diluting part of a charge. Because of this manipulation, the calculated values are rarely reliable and their composition should be confirmed by chemical analysis.

RECALIBRATION SAMPLES

When calibrating spectrometers with calibration samples (reference samples)
Recalibration samples are measured a number of times in order to obtain a reliable nominal value suitable for calibration. The additive and/or multiplicative changes in the sensitivity of the spectrometer bring about displacements of the calibration curves in the linear scale of the co-ordinate system. In order to trace (calculate) the actual intensity values at any later time back to the nominal intensity values submitted at the time of calibration a low (LP) and a high (HP) intensity is required for each analyte channel. In metal analysis with spark discharge the low points of all the analyte channels are usually measured with the pure base (Fe, Al, Cu,...). The high points are usually measured from synthetic samples having as many elements as possible with good homogeneity and precision.

The synthetic composition is given as a guide analysis and the samples often do not lie on the calibration curves. Mathematical procedure of calibration is a automated process.
In emission spectrometry recalibration samples run out, because of the polishing of the surface before recalibration. When recalibration samples are replaced there is no guarantee that, even with the same sample number, the new sample concentrations will correspond exactly to the sample being replaced. For this reason when calibrating a spectrometer for metal analysis, a minimum supply of recalibration samples should be available, for example five recalibration samples for each type.

The frequency of recalibration depends on the instrument and its use.
Interdependence with the instrument means that devices of the same kind, specially because of different phototubes stability, must be recalibrated at different intervals. Interdependence with use means that, even if stability is the same, recalibration frequency depends on the kind of analysis (traces analysis, sorting analysis).

(Note: The above post is written in context to calibration of Spark Optical emission spectrometer for metal and alloy analysis.)


Friday, 6 December 2013

COMPARISON BETWEEN ED-XRF AND WD-XRF

We have discussed about  ED-XRF & WD-XRF in the earlier posts . Now I would like to highlight the major differences between the two X-ray techniques . The most important point of comparison are listed below ::

1. RESOLUTION :

It describes the width of the spectra peaks. The lower the resolution number the more easily an elemental line is distinguished from the nearby X-ray line intensities.

a) The resolution of the WD-XRF system is dependent on the crystal and optics design,particularly collimation, spacing and positional reproducibility. The effective resolution of a WD-XRF system may vary from 20 eV in an inexpensive bench top to 5 eV or less in a laboratory instrument. The resolution is not detector dependant.

Advantage of WD-XRF: High resolution means fewer spectral overlaps and lower
background intensities

b)  The resolution of ED-XRF system is dependent on the resolution of the detector. This can vary from 150 V or less for a liquid nitrogen cooled Si(Li) detector, 150 – 220 eV for various solid state detectors, or 600 eV or more for gas filled proportional counter.

Advantage of ED-WRF: WD-XRF crystal and optics are expensive, and are one more failure mode.

2. SPECTRAL OVERLAPS:

Spectral deconvolutions are necessary for determining net intensities when two spectral lines overlap because the resolution is too high for them to be measured independently.

a) With a WD-XRF instrument with very high resolution (low number of eV) spectral
overlap corrections are not required for a vast majority of elements and applications.
The gross intensities for each element can be determined in a single acquisition.

Advantage WD-XRF: Spectral deconvolutions routines introduce error due to counting statistics for every overlap correction onto every other element being corrected for. This can double or triple the error

b) The ED-XRF analyzer is designed to detect a group of elements all at once. The some type of deconvolutions method must b used to correct for spectral overlaps. Overlaps are less of a problem with 150 eV resolution systems, but are significant when compared to WD-XRF. Spectral overlaps become more problematic at lower resolutions.

3. BACKGROUND: 

The background radiation is one limiting factor for determining detection limits, repeatability, and reproducibility.

a) Since a WD-XRF instrument usually uses direct radiation flux the background in the region of interest is directly related to the amount of continuum radiation within the region of interest the width is determined by the resolution.

b) The ED-XRF instrument uses filters and/or targets to reduce the amount of continuum radiation in the region of interest which is also resolution dependant, while producing a higher intensity X-ray peak to excite the element of interest.
Even, WD-XRF has the advantage due to the resolution. If a peak is one tenth as wide it has one tenth the background. ED-XRF counters with filters and targets that can reduce the background intensities by a factor of ten or more.

4. EXCITATION EFFICIENCY:

Usually expressed in PPM per count-per-second (cps) or similar units, this is the other main factor for determining detection limits, repeatability, and reproducibility. The relative excitation efficiency is improved by having more source x-rays closer to but above the absorption edge energy for the element of interest.

a. WDXRF generally uses direct unaltered x-ray excitation, which contains a continuum of energies with most of them not optimal for exciting the element of interest.

b. EDXRF analyzers may use filter to reduce the continuum energies at the elemental
lines, and effectively increasing the percentage of X-rays above the element absorption edge. Filters may also be used to give a filter fluorescence line immediately above the absorption edge, to further improve excitation efficiency. Secondary targets provide an almost monochromatic line source that can be optimized for the element of interest to achieve optimal excitation efficiency.