Showing posts with label spark. Show all posts
Showing posts with label spark. Show all posts

Thursday, 26 February 2015

CALIBRATION AND THE ROLE OF CALIBRATION SAMPLES IN METAL OPTICAL EMISSION SPECTROMETER.

THEORY OF CALIBRATION:

Concentration vs Intensity calibration curve
Calibration comprises measurement of calibration samples and determination of the functional relationship between the intensity ‘I’ of the line of an analyte and its concentration c in these samples. The functional relationship is the calibration function or calibration curve. It includes relationships between vaporisation, excitation, radiation offtake, dispersion and the measured value. Since spectrochemical analysis is a process of analysis is a process of analysis by comparison ( in contrast to absolute methods such as weighing ), it is necessary to carry out calibration with samples of accurately known concentration, the calibration samples.

The calibration function must not be confused with the function inverse to it-the read out or evaluation function. In the case of the calibration function I = f1 (c), the concentrations of the calibration samples are assumed to be free of error, and the errors (deviations from a best fit curve after correction of the intensities for systematic errors) are imputed entirely to the spectrometer method, so that the preconditions for regression calculations showing correlation coefficients as a quality index are useless. With the evaluation function c = f2 = ( I ) the concentration c of an analyte in an analytical sample is determined, which is accordingly subject to error, f2 = 1/f1.

For optical emission spectrometry there is no theory of calibration curves which can be used for practical purposes. There are formulae for which it is assumed that it is possible to represent the relationship between line intensity and concentration as a power function : I = I0 ck. The calibration function can be represented mathematically in various ways :

linear calibration function : I = f(c) = a0 + a1 c
non-linear calibration function : I =f(c) = a0 + a1 c +a2 c2+...+an cn

The extent to which the regression approaches the true course of the calibration
curve can be discerned from the residual scatter, namely at the point when the
addition of further terms to the approximation function does not produce any
further improvement in the residual scatter.

CALIBRATION SAMPLES


Fundamental role of the calibration samples is attested by international community and by International Standardisation Organization (ISO), which delivered the following definitions :
Reference Materials (RM) : they are Materials or substances whose properties are so well defined that they can be used to calibrate the instrument, verify the measure or assign values to the materials.

CRM sample with Spark analysis spots
Certified Reference Materials (CRM) : they are Materials whose values concerning one or more properties are certified by means of a valid technical procedure and equipped by a Certificate or other documents from a qualified technical Body ( public or private Organization or Society., which deliver a certificate for the Reference Material )

Calibration samples present three disadvantages :
1) They are expensive
2) Their dimensions and shapes are not always available for the sample-holder stand of the spectrometer.
3) They are available only for some elements and concentrations

In some cases calibration samples can be synthesised, for example by alloying or diluting part of a charge. Because of this manipulation, the calculated values are rarely reliable and their composition should be confirmed by chemical analysis.

RECALIBRATION SAMPLES

When calibrating spectrometers with calibration samples (reference samples)
Recalibration samples are measured a number of times in order to obtain a reliable nominal value suitable for calibration. The additive and/or multiplicative changes in the sensitivity of the spectrometer bring about displacements of the calibration curves in the linear scale of the co-ordinate system. In order to trace (calculate) the actual intensity values at any later time back to the nominal intensity values submitted at the time of calibration a low (LP) and a high (HP) intensity is required for each analyte channel. In metal analysis with spark discharge the low points of all the analyte channels are usually measured with the pure base (Fe, Al, Cu,...). The high points are usually measured from synthetic samples having as many elements as possible with good homogeneity and precision.

The synthetic composition is given as a guide analysis and the samples often do not lie on the calibration curves. Mathematical procedure of calibration is a automated process.
In emission spectrometry recalibration samples run out, because of the polishing of the surface before recalibration. When recalibration samples are replaced there is no guarantee that, even with the same sample number, the new sample concentrations will correspond exactly to the sample being replaced. For this reason when calibrating a spectrometer for metal analysis, a minimum supply of recalibration samples should be available, for example five recalibration samples for each type.

The frequency of recalibration depends on the instrument and its use.
Interdependence with the instrument means that devices of the same kind, specially because of different phototubes stability, must be recalibrated at different intervals. Interdependence with use means that, even if stability is the same, recalibration frequency depends on the kind of analysis (traces analysis, sorting analysis).

(Note: The above post is written in context to calibration of Spark Optical emission spectrometer for metal and alloy analysis.)


Friday, 3 May 2013

OPTICAL EMISSION SPECTROSCOPY

Optical Emission Spectrometry (OES) is a fast, accurate and reliable method for quantitative analysis of  metals to about 1–3% relative precision.Optical emission spectroscopy methods are among the most useful and flexible means of performing elemental analysis of Steel ,Copper , Aluminium,Magnesium, Lead etc and its alloys. Accurate analysis of metals and alloys requires that :

• The melt or bulk sample is homogeneous;
• Samples are representative of the melt or bulk sample  and
• The metallurgical structure of the sample is similar to that of the standards used. The sample requirements are met by chill-cast disk samples collected as described in ASTM E 716-94 (or equivalents AS2612-83 or JISH 1305-1976). For the point-to-plane method of spectrochemical analysis  , samples are machined on a lathe to give a smooth, clean surface just prior to analysis.
The sample is mounted in the spectrometer and a spark is generated between the sample and a tungsten electrode. The material is volatilized from the surface of the sample resulting in the emission of light. This light is diffracted into its component wavelengths inside the spectrometer. Fixed detectors simultaneously measure light intensity at wavelengths characteristic of each element. OES requires calibration of the spectrometer
with certified chill-cast standards, which must have the same matrix as the alloys to be tested. Therefore
quantitative OES can only be performed on chillcast samples collected from the melt according to
standard methods. Other techniques, such as Induction Coupled Plasma (ICP), can be used for
quantitative analysis of alloys in other forms, for example billet slices, ingots, extrusions and forgings.

OES PRINCIPLE


The OES system consists of four main parts :
• Sample stand.
• Spark generator.
• Optics assembly.
• Data Acquisition Electronics assembly.

The clean sample is mounted in the stand and a spark is generated between the sample and a tungsten electrode. An example of this setup is illustrated in Figure 1. High purity argon is used as a discharge atmosphere to prevent any interaction between the atmosphere and the sample surface.

The material is violated from the surface of the sample resulting in the emission of light. When atoms are excited by an external energy source, some electrons move into higher energy levels. As these electrons drop back to their original levels, the atoms emit light (photons) of characteristic wavelength. The spectrometer collects the light emitted from the sample and splits it into its component wavelengths using a diffraction grating. Fixed detectors (photo multiplier tubes in above figure) simultaneously measure light intensity at wavelengths characteristic of each element. This is illustrated in Figure above. The intensity of the signals depends on the number of photons produced per unit time. The spectrometer is programmed for fixed sample types, elements and concentration ranges and only give results within the limits of calibration .